Externally constrained plastic flow in miniaturized metallic structures: A continuum-based approach to thin films, lines, and joints

Progress in Materials Science

Volumn 53, Issue 5, 2008, Pages 838-891

  Shen, Y L ^a  

^a MSC01 1070   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PLASTICITY; SEMICONDUCTOR DEVICES; THIN FILMS;

DEFORMATION FEATURES; MINIATURIZED METALLIC STRUCTURES; PHYSICAL CONFINEMENT; SMALL SCALE PLASTICITY;

PLASTIC FLOW;

EID: 44749083645     PISSN: 00796425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.pmatsci.2008.03.001     Document Type: Review

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