Local strains measured in Al lines during thermal cycling and electromigration using convergent-beam electron diffraction

Journal of Materials Research

Volumn 20, Issue 7, 2005, Pages 1851-1859

  Nucci, J ^a   Kramer S ^a,c   Arzt, E ^a   Volkert, C A ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTROMIGRATION; ELECTRON DIFFRACTION; PLASTICITY; STRAIN MEASUREMENT; THERMAL CYCLING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CONVERGENT-BEAM ELECTRON DIFFRACTION; ELECTROMIGRATION ANALYSIS; SOURCE-LIMITED DISLOCATION ACTIVITY;

ALUMINUM;

EID: 29044434140     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0231     Document Type: Article

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