Observation of dislocation disappearance in aluminum thin films and consequences for thin film properties

Materials Research Society Symposium - Proceedings

Volumn 505, Issue , 1998, Pages 149-154

  Muellner, P ^a   Arzt, E ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AMORPHOUS MATERIALS; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); STRENGTH OF MATERIALS; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

THIN FILM EFFECT;

METALLIC FILMS;

EID: 0031631541     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)