Structure and strength of multilayers

MRS Bulletin

Volumn 24, Issue 2, 1999, Pages 20-26

  Clemens, B M ^a   Kung, H ^a   Barnett, S A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; HARDNESS; INTERFACES (MATERIALS); MULTILAYERS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION;

ATOMIC-SCALE MULTILAYERS;

NANOSTRUCTURED MATERIALS;

EID: 0033076264     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400051502     Document Type: Article

References (50)

1. P.B. Mirkarimi, M. Shinn, and S.A. Barnett, J. Vac. Sci. Technol. A 10 (1992) p. 75.
2. A.P. Payne, B.M. Clemens, and S.M. Brennan, Rev. Sci. Instrum. 63 (1992) p. 1147.
3. B.M. Lairson, M.R. Visokay, R. Sinclair, S. Hagstrom, and B.M. Clemens, Appl. Phys. Lett. 61 (1992) p. 1390.
4. B.J. Daniels, PhD thesis, Stanford University, 1995.
5. W.C. Oliver, R. Hutchings, and J.B. Pethica, ASTM Spec. Tech. Pub. 889 (1986) p. 90.
6. W.C. Oliver and G.M. Pharr, J. Mater. Res. 7 (1992) p. 1564.
7. B.D. Fabes, W.C. Oliver, R.A. McKee, and F.J. Walker, ibid. p. 3056.
8. M.F. Doerner and W.D. Nix, ibid. 1 (1986) p. 601.
9. E.E. Fullerton, I.K. Schuller, H. Vanderstraeten, and Y. Bruynseraede, Phys. Rev. B 45 (1992) p. 9292.
10. Ibid., MRS Bulletin XVII (1992) p. 33.
11. B.M. Clemens and J.G. Gay, Phys. Rev. B 35 (1987) p. 9337.
12. B.J. Daniels, W.D. Nix, and B.M. Clemens, in Polycrystalline Thin Films - Structure. Texture, Properties and Applications, edited by K. Barmak, M.A. Parker, J.A. Floro, R. Sinclair, and D.A. Smith (Mater. Res. Soc. Symp. Proc. 343, Pittsburgh, 1994) p. 549.
13. Y-C. Lu, H. Kung, M.A. Nastasi, C.T. Necker, M.G. Hollander, P.D. Peralta, and T.E. Mitchell J. Vac. Sci. Technol. submitted 1998.
14. Y-C. Lu, H. Kung, A.J. Griffin, Jr., M.A. Nastasi, and T.E. Mitchell J. Mater. Res. 12 (1997) p. 1939.
15. H. Kung, Y-C. Lu, A.J. Griffin, Jr., M.A. Nastasi, T.E. Mitchell, and J.D. Embury, Appl. Phys. Lett. 71 (1997) p. 2103.
16. A. Misra, H. Kung, T.E. Mitchell, T. Jervis, and M.A. Nastasi, in Thin Films: Stresses and Mechanical Properties VII, edited by R.C. Cammarata, E.P. Busso, M.A. Nastasi, and W.C. Oliver (Mater. Res. Soc. Symp. Proc. 505, Warrendale, PA, 1998).
17. B.J. Daniels, W.D. Nix, and B.M. Clemens, in Thin Films: Sresses and Mechanical Properties V, edited by S.P. Baker, C.A. Ross, P.H. Townsend, C.A. Volkert, and P. Børgesen (Mater. Res. Soc. Symp. Proc. 356, Pittsburgh, 1995) p. 373.
18. G.R. English, G.F. Simenson, B.M. Clemens, and W.D. Nix, ibid. p. 363.
19. A. Madan, Y-Y. Wang, S.A. Barnett, C. Engstrom, H. Ljungcrantz, L. Hultman, and M. Grimsditch, J. Appl. Phys. 84 (1998) p. 776.
20. L. Hultman, M. Shinn, P.B. Mirkarimi, and S.A. Barnett, J. Cryst. Growth 135 (1994) p. 309.
21. A.P. Payne, W.D. Nix, B.M. Lairson, and B.M. Clemens, Phys. Rev. B 47 (13) (1993) p. 730.
22. A.P. Payne, B.M. Lairson, S.M. Brennan, B.J. Daniels, N.M. Rensing, and B.M. Clemens, ibid. (16) p. 16064.
23. J.A. Bain, L.J. Chyung, S.M. Brennan, and B.M. Clemens, ibid. 44 (1991) p. 1184.
24. X. Chu, PhD thesis, Northwestern University, 1995.
25. M.L. Wu, X.W. Lin, V.P. Dravid, Y.W. Chung, M.S. Wong, and W.D. Sproul, J. Vac. Sci. Technol. A 15 (1997) p. 946.
26. D. Li, X.W. Lin, S.C. Cheng, V.P. Dravid, Y.W. Chung, M.S. Wong, and W.D. Sproul, Appl. Phys. Lett. 68 (1996) p. 1211.
27. S.R. Goodman, S.S. Brenner, and J.T. Low, Metall. Trans. 4 (1973) p. 2363.
28. B. Heinrich, A.S. Arrott, J.F. Cochran, Z. Celinski, and K. Myrtle, in Science and Technology of Nanostructured Magnetic Materials, edited by G.C. Hadjipanayis and G.A. Prinz (Plenum Press, New York, 1991) p. 15.
29. C. Schmidt, F. Ernst, M.W. Finnis, and V. Vitek, Phys. Rev. Lett. 75 (1995) p. 2160.
30. M. El-Batanouny and M. Strongin, Phys. Rev. B 31(1985) p. 4798.
31. M.W. Ruckman, M. Strongin, and X. Pan in Physical and Chemical Properties of Thin Metal Overlayers and Alloy Surfaces, edited by D.M. Zehner (Mater. Res. Soc. Symp. Proc. 83, Pittsburgh, 1987) p. 85.
32. T.C. Hufnagel, M.C. Kautzky, B.J. Daniels, and B.M. Clemens, J. Appl. Phys. In press.
33. S.P. Baker, M.K. Small, J.J. Vlassak, B.J. Daniels, and W.D. Nix, in Proc. NATO Advanced Study Institute, Mechanical Properties, and Deformation Behavior of Materials Having Ultra Fine Microstructures (Praia do Porto Novo, Portugal, June 29-July 30, 1992).
34. M.K. Small, B.J. Daniels, B.M. Clemens, and W.D. Nix, J. Mater. Res. 9 (1994) p. 25.
35. M. Shinn and S.A. Barnett, Appl. Phys. Lett. 64 (1994) p. 61.
36. A. Misra, M. Verdier, Y-C. Lu, H. Kung, T.E. Mitchell, M.A. Nastasi, and J.D. Embury, Scripta Mater. 39 (1998) p. 555.
37. J.S. Koehler, Phys. Rev. B 2 (1970) p. 547.
38. A.K. Head, Philos. Mag. 44 (1953) p. 92.
39. P. Yashar, X. Chu, S.A. Barnett, J. Rechner, Y.Y. Wang, M.S. Wong, and W.D. Sproul, Appl. Phys. Lett. 72 (1998) p. 9879.
40. M.F. Doerner, PhD thesis, Stanford University, 1987.
41. J. Sevillano, "Strength of Metals and Alloys," Proc. ICSMA 5, edited by P. Haasen, V. Gerold, and G. Kostorz (Pergammon Press, New York, 1979) p. 819.
42. R.W. Armstrong, "The Influence of Polycrystalline Grain Size on Mechanical Properties," in Advances in Materials Research, vol. 4, edited by H. Herman (Interscience Publishers, New York, 1970) p. 101.
43. P.M. Anderson and C. Li, Nanostruc. Mater. 5 (1995) p. 349.
44. T.E. Mitchell, Y-C. Lu, A.J. Griffin, Jr., M.A. Nastasi, and H. Kung, J. Am. Ceram. Soc. 80 (1997) p. 1673.
45. W.D. Nix, Mater. Sci. Eng. A 234-236 (1997) p. 37.
46. X. Chu and S.A. Barnett, J. Appl. Phys. 77 (1995) p. 4403.
47. M. Shinn, L. Hultman, and S.A. Barnett, J. Mater. Res. 7 (1992) p. 901.
48. B.J. Daniels, W.D. Nix, and B.M. Clemens, in Structure and Properties of Multilayered Thin Films, edited by T.D. Nguyen, B.M. Lairson, B.M. Clemens, S-C. Shin, and K. Sato (Mater. Res. Soc. Symp. Proc. 382, Pittsburgh, 1995) p. 315.
49. Ibid., Thin Solid Films 253 (1994) p. 218.
50. M. Verdier, M. Niewczas, J.D. Embury, M.A. Nastasi, and H. Kung, in Fundamentals of Nanoindentation and Nanotribology, edited by S. Baker, N. Burnham, W. Gerberich, and N. Moody. (Mater. Res. Soc. Symp. Proc. 522, Warrendale, PA, 1998).