SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Applied Physics Letters

Volumn 85, Issue 16, 2004, Pages 3435-3437

Stretchability of thin metal films on elastomer substrates

(5) Li, Teng a Huang, Zhenyu a Suo, Z a Lacour, Stephanie P b Wagner, Sigurd b

a HARVARD UNIVERSITY (United States)

b Princeton University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM LAYERS; DEFORMATION THEORY; FINITE ELEMENT CODE; THIN METAL FILMS;

CHROMIUM; COPPER; ELASTIC MODULI; ELASTOMERS; ELECTRIC CONDUCTANCE; PLASTIC DEFORMATION; POLYIMIDES;

THIN FILMS;

EID: 9744275958 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1806275 Document Type: Article

Times cited : (292)

References (17)

1
- 2342486652
- S. R. Forrest, Nature (London) 428, 911 (2004).
- (2004) Nature (London) , vol.428 , pp. 911
- Forrest, S.R.¹

2
- 0035942286
- J. A. Rogers, Z. Bao, K. Baldwin, A. Dodabalapur, B. Crone, V. R. Raju, V. Kuck, H. Katz and K. Amundson, J. Ewing, and P. Drzaic, Proc. Natl. Acad. Sci. U.S.A. 98, 4835 (2001).
- (2001) Proc. Natl. Acad. Sci. U.S.A. , vol.98 , pp. 4835
- Rogers, J.A.¹ Bao, Z.² Baldwin, K.³ Dodabalapur, A.⁴ Crone, B.⁵ Raju, V.R.⁶ Kuck, V.⁷ Katz, H.⁸ Amundson, K.⁹ Ewing, J.¹⁰ Drzaic, P.¹¹

3
- 2442530845
- E. Bonderover and S. Wagner, IEEE Electron Device Lett. 25, 295 (2004).
- (2004) IEEE Electron Device Lett. , vol.25 , pp. 295
- Bonderover, E.¹ Wagner, S.²

4
- 0005656435
- V. J. Lumelsky, M. S. Shur, and S. Wagner, IEEE Sens. J. 1, 41 (2001).
- (2001) IEEE Sens. J. , vol.1 , pp. 41
- Lumelsky, V.J.¹ Shur, M.S.² Wagner, S.³

5
- 0038426805
- D. W. Pashley, Proc. R. Soc. London A 255, 218 (1960).
- (1960) Proc. R. Soc. London A , vol.255 , pp. 218
- Pashley, D.W.¹

6
- 0034226704
- H. Huang and F. Spaepen, Acta Mater. 48, 3261 (2000).
- (2000) Acta Mater. , vol.48 , pp. 3261
- Huang, H.¹ Spaepen, F.²

7
- 36448999689
- S. L. Chiu, J. Leu, and P. S. Ho, J. Appl. Phys. 76, 5136 (1994).
- (1994) J. Appl. Phys. , vol.76 , pp. 5136
- Chiu, S.L.¹ Leu, J.² Ho, P.S.³

8
- 0037075747
- B. E. Alaca, M. T. A. Saif, and H. Sehitoglu, Acta Mater. 50, 1197 (2002).
- (2002) Acta Mater. , vol.50 , pp. 1197
- Alaca, B.E.¹ Saif, M.T.A.² Sehitoglu, H.³

9
- 1842431119
- D. S. Gray, J. Tien, and C. S. Chen, Adv. Mater. (Weinheim, Ger.) 16, 393 (2004).
- (2004) Adv. Mater. (Weinheim, Ger.) , vol.16 , pp. 393
- Gray, D.S.¹ Tien, J.² Chen, C.S.³

10
- 84862481429
- (in press); preprint: Publication 148
- T. Li, Z. Y. Huang, Z. C. Xi, S. P. Lacour, S. Wagner, and Z. Suo, Mech. Mater. (in press); preprint: Publication 148, www.deas.harvard.edu/suo/
- Mech. Mater.
- Li, T.¹ Huang, Z.Y.² Xi, Z.C.³ Lacour, S.P.⁴ Wagner, S.⁵ Suo, Z.⁶

11
- 9744228222
- Ph.D. Thesis, Univ. of Texas at Austin
- Y.-S. Kang, Ph.D. Thesis, Univ. of Texas at Austin, 1996.
- (1996)
- Kang, Y.-S.¹

12
- 9744225387
- private communication
- Y, Xiang and J. Vlassak (private communication).
- Xiang, Y.¹ Vlassak, J.²

13
- 0037651101
- S. P. Lacour, S. Wagner, Z. Huang, and Z. Suo, Appl. Phys. Lett. 82, 2404 (2003).
- (2003) Appl. Phys. Lett. , vol.82 , pp. 2404
- Lacour, S.P.¹ Wagner, S.² Huang, Z.³ Suo, Z.⁴

14
- 1942424145
- S. P. Lacour, J. Jones, Z. Suo, and S. Wagner, IEEE Electron Device Lett. 25, 179 (2004).
- (2004) IEEE Electron Device Lett. , vol.25 , pp. 179
- Lacour, S.P.¹ Jones, J.² Suo, Z.³ Wagner, S.⁴

15
- 18144402200
- ABAQUS, Pawtucket, RI
- The ABAQUS Analysis User's Manual, ABAQUS, Pawtucket, RI.
- The ABAQUS Analysis User's Manual

16
- 71149121504
- J. W. Hutchinson and Z. Suo, Adv. Appl. Mech. 29, 63 (1991).
- (1991) Adv. Appl. Mech. , vol.29 , pp. 63
- Hutchinson, J.W.¹ Suo, Z.²

17
- 0343026607
- V. B. Shenoy and L. B. Freund, J. Mech. Phys. Solids 47, 2209 (1999).
- (1999) J. Mech. Phys. Solids , vol.47 , pp. 2209
- Shenoy, V.B.¹ Freund, L.B.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.