Yielding and strain hardening of thin metal films on substrates

Scripta Materialia

Volumn 39, Issue 4-5, 1998, Pages 545-554

  Nix, William D ^a  

^a Stanford University ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); MATHEMATICAL MODELS; STRAIN HARDENING; STRENGTH OF MATERIALS; STRESS RELAXATION; SUBSTRATES; THIN FILMS; YIELD STRESS;

PASSIVATION RIGIDITY; SCREW DISLOCATION MODEL; STRENGTHENING EFFECTS;

METALLIC FILMS;

EID: 0032482761     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(98)00195-X     Document Type: Article

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