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Volumn 85, Issue 9, 1999, Pages 6477-6485

Analysis of local mechanical stresses in and near tungsten lines on silicon substrate

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001240614     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370151     Document Type: Article
Times cited : (26)

References (23)
  • 1
    • 84971985398 scopus 로고
    • "Metallization for Integrated Circuit Manufacturing,"
    • In "Metallization for Integrated Circuit Manufacturing," MRS Bull. XX (11) (1995).
    • (1995) MRS Bull. , vol.20 , Issue.11
  • 6
    • 0000736871 scopus 로고    scopus 로고
    • I. De Wolf, S. Jones, and H. E. Mass, J. Appl. Phys. 79, 7148 (1996); I. De Wolf, and E. Anastassakis J. Appl. Phys. Addendum (to be published).
    • (1996) J. Appl. Phys. , vol.79 , pp. 7148
    • De Wolf, I.1    Jones, S.2    Mass, H.E.3
  • 10
    • 0019176185 scopus 로고
    • The Measurement of Residual Stresses by X-ray Diffraction Techniques
    • edited by H. Herman, Academic, New York
    • M. R. James and J. B. Cohen, "The Measurement of Residual Stresses by X-ray Diffraction Techniques," in Treatise on Material Science and Technology, edited by H. Herman (Academic, New York, 1980), Vol. 19A, pp. 1-62.
    • (1980) Treatise on Material Science and Technology , vol.19 A , pp. 1-62
    • James, M.R.1    Cohen, J.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.