Stresses and strains in lattice-mismatched stripes, quantum wires, quantum dots, and substrates in Si technology

Journal of Applied Physics

Volumn 79, Issue 11, 1996, Pages 8145-8165

  Jain, S C ^a,b   Maes, H E ^a   Pinardi, K ^a   De Wolf, I ^a  

^a IMEC   (Belgium)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000806531     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362678     Document Type: Review

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