Submicron x-ray diffraction and its applications to problems in materials and environmental science

Review of Scientific Instruments

Volumn 73, Issue 3 II, 2002, Pages 1369-

  Tamura, N ^a   Celestre, R S ^a   MacDowell, A A ^a   Padmore, H A ^a   Spolenak, R ^b   Valek, B C ^c   Meier Chang, N ^c   Manceau, A ^d   Patel, J R ^a,e  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b NOKIA RESEARCH CENTER   (United States)

^c Stanford University   (United States)

^d UNIVERSITÉ GRENOBLE ALPES   (France)

^e SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036494182     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1436539     Document Type: Conference Paper

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