메뉴 건너뛰기




Volumn 26, Issue 1, 1996, Pages 431-462

Mechanical behavior of thin films

Author keywords

Mechanical properties; Mechanical testing; Strain; Stress

Indexed keywords

ELECTRON DIFFRACTION; INTERFACES (MATERIALS); MECHANICAL PROPERTIES; MECHANICAL TESTING; MICROSTRUCTURE; MORPHOLOGY; PLASTIC FLOW; RAMAN SPECTROSCOPY; STRAIN; STRESSES; SUBSTRATES; X RAY DIFFRACTION;

EID: 0029721299     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.ms.26.080196.002243     Document Type: Article
Times cited : (214)

References (152)
  • 1
    • 0000293935 scopus 로고
    • ed. G Mass, RE Thun. New York: Academic
    • Huffman RW. 1966. In Physics of Thin Films, ed. G Mass, RE Thun. pp. 211-73. New York: Academic
    • (1966) Physics of Thin Films , pp. 211-273
    • Huffman, R.W.1
  • 2
    • 0003312415 scopus 로고
    • ed. LI Maissel, R Glang, New York: McGraw Hill
    • Campbell DS. 1970. In Handbook of Thin Films, ed. LI Maissel, R Glang, pp. 22-25. New York: McGraw Hill
    • (1970) Handbook of Thin Films , pp. 22-25
    • Campbell, D.S.1
  • 33
    • 0002310405 scopus 로고
    • ed. CA Neugebauer, JB Newkirk, DA Vermilyea. New York: Wiley & Sons
    • Beams JW. 1959. In Structure and Properties of Thin Films, ed. CA Neugebauer, JB Newkirk, DA Vermilyea. pp. 183-92. New York: Wiley & Sons
    • (1959) Structure and Properties of Thin Films , pp. 183-192
    • Beams, J.W.1
  • 82
    • 0003832681 scopus 로고
    • Encyclopedia of materials characterization: Surfaces, interfaces, thin films
    • ed CR Brundle, CA Evans, Jr. Boston: ButterworthHeinemann
    • Brundle CR, Evans CA Jr, Wilson S. 1992. Encyclopedia of materials characterization: surfaces, interfaces, thin films. In Materials Characterization Series, ed CR Brundle, CA Evans, Jr. Boston: ButterworthHeinemann
    • (1992) Materials Characterization Series
    • Brundle, C.R.1    Evans Jr., C.A.2    Wilson, S.3
  • 89
    • 0002241775 scopus 로고
    • ed. JR Singer, New York: Columbia Univ. Press
    • Schawlow AL. 1961. In Advances in Quantum Electronics, ed. JR Singer, pp. 50-64. New York: Columbia Univ. Press
    • (1961) Advances in Quantum Electronics , pp. 50-64
    • Schawlow, A.L.1
  • 101
    • 84971851196 scopus 로고
    • Freund LB. 1992. MRS Bull. 17(7): 52-60
    • (1992) MRS Bull. , vol.17 , Issue.7 , pp. 52-60
    • Freund, L.B.1
  • 116
    • 0000264081 scopus 로고
    • ed. RA Huggins, JA Giordmaine, JB Wachtman, Jr. Palo Alto: Annual Reviews
    • Thompson CV. 1990. In Annual Review of Materials Science, ed. RA Huggins, JA Giordmaine, JB Wachtman, Jr. pp. 245-68. Palo Alto: Annual Reviews
    • (1990) Annual Review of Materials Science , pp. 245-268
    • Thompson, C.V.1
  • 129
    • 0028015480 scopus 로고
    • ed. MC Flemings, JB Wachtman Jr, EN Kaufmann, J Giordmaine, Palo Alto: Annual Reviews
    • Barnett SA, Shinn M. 1994. In Annual Review of Materials Science, ed. MC Flemings, JB Wachtman Jr, EN Kaufmann, J Giordmaine, pp. 481-511. Palo Alto: Annual Reviews
    • (1994) Annual Review of Materials Science , pp. 481-511
    • Barnett, S.A.1    Shinn, M.2
  • 140
    • 0003360015 scopus 로고
    • ed. MH Francombe, JL Vossen, San Diego: Academic
    • Barnett SA. 1993. In Physics of Thin Films, ed. MH Francombe, JL Vossen, p. 1. San Diego: Academic
    • (1993) Physics of Thin Films , pp. 1
    • Barnett, S.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.