-
1
-
-
0000293935
-
-
ed. G Mass, RE Thun. New York: Academic
-
Huffman RW. 1966. In Physics of Thin Films, ed. G Mass, RE Thun. pp. 211-73. New York: Academic
-
(1966)
Physics of Thin Films
, pp. 211-273
-
-
Huffman, R.W.1
-
2
-
-
0003312415
-
-
ed. LI Maissel, R Glang, New York: McGraw Hill
-
Campbell DS. 1970. In Handbook of Thin Films, ed. LI Maissel, R Glang, pp. 22-25. New York: McGraw Hill
-
(1970)
Handbook of Thin Films
, pp. 22-25
-
-
Campbell, D.S.1
-
33
-
-
0002310405
-
-
ed. CA Neugebauer, JB Newkirk, DA Vermilyea. New York: Wiley & Sons
-
Beams JW. 1959. In Structure and Properties of Thin Films, ed. CA Neugebauer, JB Newkirk, DA Vermilyea. pp. 183-92. New York: Wiley & Sons
-
(1959)
Structure and Properties of Thin Films
, pp. 183-192
-
-
Beams, J.W.1
-
37
-
-
5544274244
-
-
Allen MG, Mehreeani M, Howe RT, Senturia SD. 1987. Appl. Phys. Lett. 51(4):241-43
-
(1987)
Appl. Phys. Lett.
, vol.51
, Issue.4
, pp. 241-243
-
-
Allen, M.G.1
Mehreeani, M.2
Howe, R.T.3
Senturia, S.D.4
-
43
-
-
0028203114
-
-
Small MK, Daniels BJ, Clemens BM, Nix WD. 1994. J. Mater. Res. 9(1): 25-30
-
(1994)
J. Mater. Res.
, vol.9
, Issue.1
, pp. 25-30
-
-
Small, M.K.1
Daniels, B.J.2
Clemens, B.M.3
Nix, W.D.4
-
45
-
-
0025541504
-
-
Hilton Head, NC: IEEE
-
Pan JY, Lin P, Maseeh F, Senturia SD. 1990. In IEEE Solid-State Sensor and Actuator Workshop, p. 70. Hilton Head, NC: IEEE
-
(1990)
IEEE Solid-State Sensor and Actuator Workshop
, pp. 70
-
-
Pan, J.Y.1
Lin, P.2
Maseeh, F.3
Senturia, S.D.4
-
53
-
-
0026222644
-
-
Romero JD, Khan M, Fatemi H, Turlo J. 1991. J. Mater. Res. 6(9): 1996-2003
-
(1991)
J. Mater. Res.
, vol.6
, Issue.9
, pp. 1996-2003
-
-
Romero, J.D.1
Khan, M.2
Fatemi, H.3
Turlo, J.4
-
56
-
-
85088548705
-
-
San Francisco: Mater. Res. Soc.
-
Burses U, Helneder H, Korner H, Schroeder H, Schilling W. 1994. In Materials Reliability in Microelectronics IV, 338:247-52. San Francisco: Mater. Res. Soc.
-
(1994)
Materials Reliability in Microelectronics IV
, vol.338
, pp. 247-252
-
-
Burses, U.1
Helneder, H.2
Korner, H.3
Schroeder, H.4
Schilling, W.5
-
58
-
-
0029239147
-
-
Boston: Mater. Res. Soc.
-
Surges U, Helneder H, Schneegans M, Beckers D, Hallerbach M, et al. 1995. In Thin Films: Stresses and Mechanical Properties V, 356: 423-28. Boston: Mater. Res. Soc.
-
(1995)
Thin Films: Stresses and Mechanical Properties V
, vol.356
, pp. 423-428
-
-
Surges, U.1
Helneder, H.2
Schneegans, M.3
Beckers, D.4
Hallerbach, M.5
-
59
-
-
0001106750
-
-
Yeo I-S, Anderson SGH, Ho PS, Hu CK. 1995. J. Appl. Phys. 78(2): 953-61
-
(1995)
J. Appl. Phys.
, vol.78
, Issue.2
, pp. 953-961
-
-
Yeo, I.-S.1
Anderson, S.G.H.2
Ho, P.S.3
Hu, C.K.4
-
68
-
-
0000996939
-
-
Bain JA, Chyung LJ, Brennan S, Clemens BM. 1991. Phys. Rev. B 44(3): 1184-92
-
(1991)
Phys. Rev. B
, vol.44
, Issue.3
, pp. 1184-1192
-
-
Bain, J.A.1
Chyung, L.J.2
Brennan, S.3
Clemens, B.M.4
-
79
-
-
0028714688
-
-
San Francisco: Mater. Res. Soc.
-
Yamamoto N, Homma Y, Sakata S, Hosokawa Y. 1994. In Materials Reliability in Microelectronics IV, 338: 209-14. San Francisco: Mater. Res. Soc.
-
(1994)
Materials Reliability in Microelectronics IV
, vol.338
, pp. 209-214
-
-
Yamamoto, N.1
Homma, Y.2
Sakata, S.3
Hosokawa, Y.4
-
82
-
-
0003832681
-
Encyclopedia of materials characterization: Surfaces, interfaces, thin films
-
ed CR Brundle, CA Evans, Jr. Boston: ButterworthHeinemann
-
Brundle CR, Evans CA Jr, Wilson S. 1992. Encyclopedia of materials characterization: surfaces, interfaces, thin films. In Materials Characterization Series, ed CR Brundle, CA Evans, Jr. Boston: ButterworthHeinemann
-
(1992)
Materials Characterization Series
-
-
Brundle, C.R.1
Evans Jr., C.A.2
Wilson, S.3
-
83
-
-
0000704120
-
-
Ma Q, Chiras S, Clarke DR, Suo Z. 1995. J. Appl. Phys. 78(3): 1614-22
-
(1995)
J. Appl. Phys.
, vol.78
, Issue.3
, pp. 1614-1622
-
-
Ma, Q.1
Chiras, S.2
Clarke, D.R.3
Suo, Z.4
-
84
-
-
0029536261
-
-
San Francisco: Mater. Res. Soc.
-
De Wolf I, Maes HE, Moffet J, Ignat M. 1995. In Materials Reliability in Microelectronics V, 391:109-14. San Francisco: Mater. Res. Soc.
-
(1995)
Materials Reliability in Microelectronics V
, vol.391
, pp. 109-114
-
-
De Wolf, I.1
Maes, H.E.2
Moffet, J.3
Ignat, M.4
-
87
-
-
36449005810
-
-
De Wolf I, Vanhellemont J, RomanoRodriguez A, Norstrom H. 1992. J. Appl. Phys. 71(2):898-906
-
(1992)
J. Appl. Phys.
, vol.71
, Issue.2
, pp. 898-906
-
-
De Wolf, I.1
Vanhellemont, J.2
Romanorodriguez, A.3
Norstrom, H.4
-
89
-
-
0002241775
-
-
ed. JR Singer, New York: Columbia Univ. Press
-
Schawlow AL. 1961. In Advances in Quantum Electronics, ed. JR Singer, pp. 50-64. New York: Columbia Univ. Press
-
(1961)
Advances in Quantum Electronics
, pp. 50-64
-
-
Schawlow, A.L.1
-
93
-
-
0029327251
-
-
Ma Q, Shaw MC, He MY, Dalgleish BJ, Clarke DR, Evans AG. 1995. Acta Metall. Mater. 43(6):2137-42
-
(1995)
Acta Metall. Mater.
, vol.43
, Issue.6
, pp. 2137-2142
-
-
Ma, Q.1
Shaw, M.C.2
He, M.Y.3
Dalgleish, B.J.4
Clarke, D.R.5
Evans, A.G.6
-
96
-
-
0026955688
-
-
Janssens KGF, Vanhellemont J, De Graef M, Van der Biest O. 1992. Ultramicroscopy 45(3-4):323-35
-
(1992)
Ultramicroscopy
, vol.45
, Issue.3-4
, pp. 323-335
-
-
Janssens, K.G.F.1
Vanhellemont, J.2
De Graef, M.3
Van Der Biest, O.4
-
98
-
-
7244262007
-
-
Oxford, UK: IOP
-
Janssens KGF, Vanhellemont J, Maes HE, Van der Biest O. 1993. In Microscopy of Semiconducting Materials 1993, pp. 225-28. Oxford, UK: IOP
-
(1993)
Microscopy of Semiconducting Materials 1993
, pp. 225-228
-
-
Janssens, K.G.F.1
Vanhellemont, J.2
Maes, H.E.3
Van Der Biest, O.4
-
99
-
-
0040029407
-
-
Oxford, UK: IOP
-
Armigliato A, Balboni R, De Wolf I, Frabboni S, Janssens KGF, Vanhellemont J. 1993. In Microscopy of Semiconducting Materials 1993, 229-34. Oxford, UK: IOP
-
(1993)
Microscopy of Semiconducting Materials 1993
, pp. 229-234
-
-
Armigliato, A.1
Balboni, R.2
De Wolf, I.3
Frabboni, S.4
Janssens, K.G.F.5
Vanhellemont, J.6
-
101
-
-
84971851196
-
-
Freund LB. 1992. MRS Bull. 17(7): 52-60
-
(1992)
MRS Bull.
, vol.17
, Issue.7
, pp. 52-60
-
-
Freund, L.B.1
-
105
-
-
51249175501
-
-
Venkatraman R, Bravman JC, Nix WD, Davies PW, Flinn PA, Fraser DB. 1990. J. Electron. Mater. 19(11):1231-37
-
(1990)
J. Electron. Mater.
, vol.19
, Issue.11
, pp. 1231-1237
-
-
Venkatraman, R.1
Bravman, J.C.2
Nix, W.D.3
Davies, P.W.4
Flinn, P.A.5
Fraser, D.B.6
-
112
-
-
85033025123
-
-
Boston: Mater. Res. Soc.
-
Keller R-M, Bader S, Vinci RP, Arzt E. 1994. In Thin Films: Stresses and Mechanical Properties V, 356: 453-58. Boston: Mater. Res. Soc.
-
(1994)
Thin Films: Stresses and Mechanical Properties V
, vol.356
, pp. 453-458
-
-
Keller, R.-M.1
Bader, S.2
Vinci, R.P.3
Arzt, E.4
-
113
-
-
0029478535
-
-
San Francisco: Mater. Res. Soc.
-
Keller R-M, Kuschke W-M, Kretschmann A, Bader S, Vinci RP, Arzt E. 1995. In Materials Reliability in Microelectronics V, 391:309-14. San Francisco: Mater. Res. Soc.
-
(1995)
Materials Reliability in Microelectronics V
, vol.391
, pp. 309-314
-
-
Keller, R.-M.1
Kuschke, W.-M.2
Kretschmann, A.3
Bader, S.4
Vinci, R.P.5
Arzt, E.6
-
114
-
-
0028715273
-
-
San Francisco: Mater. Res. Soc.
-
Chidambarrao D, Rodbell KP, Thouless MD, DeHaven PW. 1994. In Materials Reliability in Microelectronics IV, 338:261-68. San Francisco: Mater. Res. Soc.
-
(1994)
Materials Reliability in Microelectronics IV
, vol.338
, pp. 261-268
-
-
Chidambarrao, D.1
Rodbell, K.P.2
Thouless, M.D.3
DeHaven, P.W.4
-
115
-
-
0028595483
-
-
San Francisco: Mater. Res. Soc.
-
Besser PR, Sanchez JE Jr, Brennan S, Bravman JC, Takaoka G, Yamada I. 1994. In Polycrystalline Thin Films: Structure, Texture, Properties and Applications, 343:659-64. San Francisco: Mater. Res. Soc.
-
(1994)
Polycrystalline Thin Films: Structure, Texture, Properties and Applications
, vol.343
, pp. 659-664
-
-
Besser, P.R.1
Sanchez Jr., J.E.2
Brennan, S.3
Bravman, J.C.4
Takaoka, G.5
Yamada, I.6
-
116
-
-
0000264081
-
-
ed. RA Huggins, JA Giordmaine, JB Wachtman, Jr. Palo Alto: Annual Reviews
-
Thompson CV. 1990. In Annual Review of Materials Science, ed. RA Huggins, JA Giordmaine, JB Wachtman, Jr. pp. 245-68. Palo Alto: Annual Reviews
-
(1990)
Annual Review of Materials Science
, pp. 245-268
-
-
Thompson, C.V.1
-
125
-
-
0028576746
-
-
San Francisco: Mater. Res. Soc.
-
Carel R, Thompson CV, Frost HJ. 1994. In Polycrystalline Thin Films: Structure, Texture, Properties and Applications, 343:49-54. San Francisco: Mater. Res. Soc.
-
(1994)
Polycrystalline Thin Films: Structure, Texture, Properties and Applications
, vol.343
, pp. 49-54
-
-
Carel, R.1
Thompson, C.V.2
Frost, H.J.3
-
129
-
-
0028015480
-
-
ed. MC Flemings, JB Wachtman Jr, EN Kaufmann, J Giordmaine, Palo Alto: Annual Reviews
-
Barnett SA, Shinn M. 1994. In Annual Review of Materials Science, ed. MC Flemings, JB Wachtman Jr, EN Kaufmann, J Giordmaine, pp. 481-511. Palo Alto: Annual Reviews
-
(1994)
Annual Review of Materials Science
, pp. 481-511
-
-
Barnett, S.A.1
Shinn, M.2
-
132
-
-
0028457062
-
-
Mirkarimi PB, Barnett SA, Hubbard KM, Jervis TR, Hultman L. 1994. J. Mater. Res. 9(6): 1456-67
-
(1994)
J. Mater. Res.
, vol.9
, Issue.6
, pp. 1456-1467
-
-
Mirkarimi, P.B.1
Barnett, S.A.2
Hubbard, K.M.3
Jervis, T.R.4
Hultman, L.5
-
137
-
-
0000882773
-
-
Cammarata RC, Schlesinger TE, Kim C, Qadri SB, Edelstein AS. 1990. Appl. Phys. Lett. 56(19): 1862-64
-
(1990)
Appl. Phys. Lett.
, vol.56
, Issue.19
, pp. 1862-1864
-
-
Cammarata, R.C.1
Schlesinger, T.E.2
Kim, C.3
Qadri, S.B.4
Edelstein, A.S.5
-
138
-
-
21544470983
-
-
Li D, Chu X, Cheng S-C, Lin X-W, Dravid VP, Chung Y-W, et al. 1995. Appl. Phys. Lett. 67(2):203-5
-
(1995)
Appl. Phys. Lett.
, vol.67
, Issue.2
, pp. 203-205
-
-
Li, D.1
Chu, X.2
Cheng, S.-C.3
Lin, X.-W.4
Dravid, V.P.5
Chung, Y.-W.6
-
140
-
-
0003360015
-
-
ed. MH Francombe, JL Vossen, San Diego: Academic
-
Barnett SA. 1993. In Physics of Thin Films, ed. MH Francombe, JL Vossen, p. 1. San Diego: Academic
-
(1993)
Physics of Thin Films
, pp. 1
-
-
Barnett, S.A.1
-
146
-
-
0000972637
-
-
Hinode K, Asano I, Ishiba T, Homma Y. 1990. J. Vac. Sci. Technol B 8(3): 495-98
-
(1990)
J. Vac. Sci. Technol B
, vol.8
, Issue.3
, pp. 495-498
-
-
Hinode, K.1
Asano, I.2
Ishiba, T.3
Homma, Y.4
-
149
-
-
0028715510
-
-
San Francisco: Mater. Res.
-
Besser PR, Marieb TM, Bravman JC, Flinn PA. 1994. In Materials Reliability in Microelectronics IV, 338: 275-80. San Francisco: Mater. Res.
-
(1994)
Materials Reliability in Microelectronics IV
, vol.338
, pp. 275-280
-
-
Besser, P.R.1
Marieb, T.M.2
Bravman, J.C.3
Flinn, P.A.4
-
151
-
-
85033027939
-
-
San Francisco: Mater. Res. Soc.
-
Radier MJ, Crowder CE, Shaffer EO, Townsend PH. 1992. In Electronic Packaging Materials Science VI, 264:243-49. San Francisco: Mater. Res. Soc.
-
(1992)
Electronic Packaging Materials Science VI
, vol.264
, pp. 243-249
-
-
Radier, M.J.1
Crowder, C.E.2
Shaffer, E.O.3
Townsend, P.H.4
|