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Volumn 49, Issue 13, 2001, Pages 2365-2372

Dislocation accumulation and strengthening in Cu thin films

Author keywords

Copper; Dislocations; Mechanical properties; Stress; Thin films

Indexed keywords

COOLING; COPPER; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); NITROGEN; QUENCHING; SILICON; STRAIN HARDENING; STRENGTHENING (METAL); STRESS ANALYSIS; STRESS RELAXATION; THERMAL CYCLING; THIN FILMS;

EID: 0035426513     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(01)00170-7     Document Type: Article
Times cited : (39)

References (22)
  • 17
    • 0004553209 scopus 로고
    • Ph.D. Dissertation. Stanford University, Stanford, CA
    • (1992)
    • Venkatraman, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.