Dislocation-based modeling of the mechanical behavior of epitaxial metallic multilayer thin films

Acta Materialia

Volumn 53, Issue 4, 2005, Pages 1121-1134

  Li, Qizhen ^a   Anderson, Peter M ^a  

^a Ohio State University   (United States)

Author keywords

Dislocation; Hardening; Multilayer thin film; Yield strength

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); ELASTIC MODULI; HARDENING; INDENTATION; LATTICE CONSTANTS; MATHEMATICAL MODELS; MULTILAYERS; PLASTIC DEFORMATION; SINGLE CRYSTALS; TENSILE TESTING; YIELD STRESS;

CELLULAR AUTOMATON (CA); MULTILAYER THIN FILMS; PLASTIC STRENGTH; SLIP PROPAGATION;

THIN FILMS;

EID: 12344334722     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.11.009     Document Type: Article

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