Stable state of interconnect under temperature change and electric current

Acta Materialia

Volumn 46, Issue 11, 1998, Pages 3725-3732

  Suo, Z ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000594331     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(98)00098-6     Document Type: Article

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