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Volumn 12, Issue 9, 1997, Pages 2219-2222

Thermal stresses in multilevel interconnections: Aluminum lines at different levels

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ASPECT RATIO; FINITE ELEMENT METHOD; THERMAL STRESS;

EID: 0031235007     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1997.0296     Document Type: Article
Times cited : (22)

References (12)
  • 2
    • 0029505344 scopus 로고
    • Materials Reliability in Microelectronics V, edited by A. S. Oates, W. F. Filter, R. Rosenberg, A. L. Greer, and K. Gadepally Pittsburgh, PA
    • J. R. Lloyd, in Materials Reliability in Microelectronics V, edited by A. S. Oates, W. F. Filter, R. Rosenberg, A. L. Greer, and K. Gadepally (Mater. Res. Soc. Symp. Proc. 391, Pittsburgh, PA, 1995), p. 231.
    • (1995) Mater. Res. Soc. Symp. Proc. , vol.391 , pp. 231
    • Lloyd, J.R.1
  • 5
    • 0028715273 scopus 로고
    • Materials Reliability in Microelectronics IV, edited by P. Børgesen, J. C. Coburn, J. E. Sanchez, Jr., K. P. Rodbell, and W. F. Filter Pittsburgh, PA
    • D. Chidambarrao, K. P. Rodbell, M. D. Thouless, and P. W. DeHaven, in Materials Reliability in Microelectronics IV, edited by P. Børgesen, J. C. Coburn, J. E. Sanchez, Jr., K. P. Rodbell, and W. F. Filter (Mater. Res. Soc. Symp. Proc. 338, Pittsburgh, PA, 1994), p. 261.
    • (1994) Mater. Res. Soc. Symp. Proc. , vol.338 , pp. 261
    • Chidambarrao, D.1    Rodbell, K.P.2    Thouless, M.D.3    DeHaven, P.W.4
  • 9
    • 0004007037 scopus 로고
    • general purpose finite element program, Hibbit, Karlson and Sorensen, Inc., Pawtucket, RI
    • ABAQUS, Version 5.4, general purpose finite element program, Hibbit, Karlson and Sorensen, Inc., Pawtucket, RI (1995).
    • (1995) ABAQUS, Version 5.4
  • 11
    • 85033161670 scopus 로고    scopus 로고
    • note
    • The Si single crystal has anisotropic elastic properties. In the calculations Si is assumed to be isotropic with the Young modulus and the Poisson ratio taken to be those along the [100] crystallographic direction. The error induced by this isotropy assumption has been found to be negligible (see Ref. 10).
  • 12
    • 85033160093 scopus 로고    scopus 로고
    • note
    • yy in a passivated Al line under certain geometrical conditions.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.