Activation volume for inelastic deformation in polycrystalline Ag thin films

Acta Materialia

Volumn 48, Issue 3, 2000, Pages 625-633

  Kobrinsky, Mauro J ^a   Thompson, Carl V ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DISLOCATIONS (CRYSTALS); GRAIN SIZE AND SHAPE; PLASTIC DEFORMATION; POLYCRYSTALLINE MATERIALS; SILICON; SILVER; STRESS ANALYSIS; STRESS RELAXATION; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

INELASTIC DEFORMATION;

METALLIC FILMS;

EID: 0033880206     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00403-6     Document Type: Article

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