In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate

Applied Physics Letters

Volumn 77, Issue 8, 2000, Pages 1126-1128

  Dehm, Gerhard ^a   Arzt, Eduard ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001103030     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1289488     Document Type: Article

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