Atomic force microscopy study of plastic deformation and interfacial sliding in Al thin film: Si substrate systems due to thermal cycling

Applied Physics Letters

Volumn 77, Issue 26, 2000, Pages 4298-4300

  Chen, M W ^a   Dutta, I ^a  

^a Naval Postgraduate School ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000979505     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1332098     Document Type: Article

References (14)

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