New method to study cyclic deformation of thin films in tension and compression

Journal of Materials Research

Volumn 14, Issue 6, 1999, Pages 2373-2376

  Hommel, M ^a   Kraft, O ^a   Arzt, E ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; COPPER; CRYSTAL ORIENTATION; FATIGUE OF MATERIALS; METALLIC FILMS; PLASTIC DEFORMATION; STRAIN; STRESS RELAXATION; SUBSTRATES; TENSILE STRESS; X RAY DIFFRACTION ANALYSIS;

CYCLIC DEFORMATION; STRESS STRAIN HYSTERESIS CURVE;

THIN FILMS;

EID: 0032623850     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.1999.0317     Document Type: Article

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