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Volumn , Issue , 2011, Pages 462-488

Evolution, challenge, and outlook of TSV, 3D IC integration and 3d silicon integration

Author keywords

3D IC integration; 3D Si integration; active and passive interposers; C2W and W2W bonding; TSV

Indexed keywords

3-D INTEGRATION; 3D IC INTEGRATION; 3D SI INTEGRATION; ACTIVE AND PASSIVE INTERPOSERS; IC PACKAGING; ROAD-MAPS; SILICON INTEGRATION; TSV;

EID: 84856481677     PISSN: 15505723     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAPM.2011.6105753     Document Type: Conference Paper
Times cited : (162)

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