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Volumn , Issue , 2011, Pages 274-278
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Development of Super Thin TSV PoP
b
Nokia Japan
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
3D PACKAGING;
ASSEMBLY PROCESS;
CELLULAR PHONE;
COMPONENT LEVELS;
ELECTRICAL PERFORMANCE;
FLIP CHIP;
LAMINATE SUBSTRATES;
MICROSYSTEM DEVICES;
MOBILE APPLICATIONS;
RELIABILITY TEST;
SEMICONDUCTOR INDUSTRY;
TEST VEHICLE;
THICKNESS REDUCTION;
THROUGH-SILICON-VIA;
TIMING DELAY;
WAFER LEVEL PACKAGE;
WARPAGES;
BEHAVIORAL RESEARCH;
CHIP SCALE PACKAGES;
DIES;
SEMICONDUCTOR DEVICE MANUFACTURE;
SILICON WAFERS;
TECHNOLOGY;
TESTING;
THREE DIMENSIONAL;
VEHICLES;
PACKAGING;
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EID: 79960409855
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.2011.5898525 Document Type: Conference Paper |
Times cited : (2)
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References (4)
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