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Lau, J. H., with W. Jung and Y. Pao, "Nonlinear Analysis of Full-Matrix and Perimeter Plastic Ball Grid Array Solder Joints", ASME Transactions, Journal of Electronic Packaging, Vol. 119, September 1997, pp. 163-170.
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Parès, G., N. Bresson, S. Moreau, V. Lapras, D. Henry, and N. Sillon., "Effects of Stress in Polysilicon VIA - First TSV Technology", Proceedings of IEEE Electronic Packaging Technology Conference, December 2010, PP. 333-337.
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Portland, OR, July
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