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Volumn , Issue , 2010, Pages 316-322

Carrierless design for handling and processing of ultrathin wafers

Author keywords

[No Author keywords available]

Indexed keywords

BUMPING PROCESS; CARRIER WAFERS; CARRIER-LESS; FULL INTEGRATION; MECHANICAL INTEGRITY; PROCESSING TECHNOLOGIES; THROUGH-SILICON-VIA; ULTRA-THIN;

EID: 77955212796     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2010.5490953     Document Type: Conference Paper
Times cited : (27)

References (8)
  • 1
    • 70349657404 scopus 로고    scopus 로고
    • Temporary bonding and debonding enabling TSV formation and 3D integration for ultra-thin wafers
    • Singapore, December
    • th Electronic Packaging and Technology Conf, Singapore, December 2008, pp. 1301-1305.
    • (2008) th Electronic Packaging and Technology Conf , pp. 1301-1305
    • Pargfrieder, S.1
  • 3
    • 70349686483 scopus 로고    scopus 로고
    • Integration of a Temporary Carrier in a TSV Process Flow
    • Las Vegas, May
    • Charbonnier, J et al, : "Integration of a Temporary Carrier in a TSV Process Flow" Proc 59th Electronic Components and Technology Conf, Las Vegas, May 2009, pp. 865-871.
    • (2009) Proc 59th Electronic Components and Technology Conf , pp. 865-871
    • Charbonnier, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.