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Volumn , Issue , 2010, Pages 1696-1698

Process solutions and polymer materials for 3D-WLP through silicon via filling

Author keywords

[No Author keywords available]

Indexed keywords

3D STACKING; DRY FILM RESIST; LIQUID RESIN; MATERIAL CHARACTERIZATIONS; POLYMER FILLING; POLYMER MATERIALS; PROCESS OPTIMIZATION; PROCESS SOLUTIONS; THERMO-MECHANICAL; THROUGH-SILICON-VIA;

EID: 77955220203     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2010.5490748     Document Type: Conference Paper
Times cited : (20)

References (7)
  • 1
    • 74649084370 scopus 로고    scopus 로고
    • Through silicon via: From the CMOS imager sensor wafer level package to the3D integration
    • doi:10.1016/j.mee.2009.05.035
    • X. Gagnard, T. Mourier, "Through silicon via: from the CMOS imager sensor wafer level package to the3D integration", Microelectron. Eng. (2009), doi:10.1016/j.mee.2009.05.035.
    • (2009) Microelectron. Eng.
    • Gagnard, X.1    Mourier, T.2
  • 2
    • 77955190080 scopus 로고    scopus 로고
    • Handbook of 3D Integration
    • P. Garrou et Al, "Handbook of 3D Integration", Weinheim 2008.
    • (2008) Weinheim
    • Garrou, P.1
  • 3
    • 63049135179 scopus 로고    scopus 로고
    • Through silicon vias technology for CMOS image sensors packaging: Presentation of technology and electrical results
    • december Singapour
    • D. Henry et Al, "Through silicon vias technology for CMOS image sensors packaging: presentation of technology and electrical results", EPTC 2008, 9-12 december 2008, Singapour.
    • (2008) EPTC 2008 , pp. 9-12
    • Henry, D.1
  • 4
    • 23944470605 scopus 로고    scopus 로고
    • An evaluation process of polymeric adhesive wafer bonding for vertical system integration
    • Y. Kwon, J. Seok, "An evaluation process of polymeric adhesive wafer bonding for vertical system integration", Japanese Journal of Applied Physics, Vol.44, pp. 3893-3902, 2005.
    • (2005) Japanese Journal of Applied Physics , vol.44 , pp. 3893-3902
    • Kwon, Y.1    Seok, J.2
  • 5
    • 33644965503 scopus 로고    scopus 로고
    • J. L. Hay-MTS Systems Corporation G. M. Pharr-The University of Tennessee and Oak Ridge National Laboratory, Materials Park, OH: ASM International
    • J. L. Hay-MTS Systems Corporation, G. M. Pharr-The University of Tennessee and Oak Ridge National Laboratory, "Instrumented Indentation Testing", Materials Park, OH: ASM International, p232-243, 2000.
    • (2000) Instrumented Indentation Testing , pp. 232-243
  • 6
    • 33748800241 scopus 로고    scopus 로고
    • A simple guide to determine elastic properties of films on substrate from nanoindentation experiments
    • S. Bec, A. Tonck, J. L. Loubet, "A Simple Guide to Determine Elastic Properties of Films on Substrate from Nanoindentation Experiments", Phylosophical Magazine, Vol.86, No.33-35, pp. 5347-5358, 2006.
    • (2006) Phylosophical Magazine , vol.86 , Issue.33-35 , pp. 5347-5358
    • Bec, S.1    Tonck, A.2    Loubet, J.L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.