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Volumn , Issue , 2010, Pages 309-315

Wafer level embedded system in package (WL-eSiP) for mobile applications

Author keywords

[No Author keywords available]

Indexed keywords

BALL MOUNTING; BOARD-LEVEL RELIABILITY; CHIP SIZES; CURVATURE EVALUATION; DIE SIZE; ELECTRONICS MARKETS; FLIP-CHIP BONDING; HIGH ASPECT RATIO; MANUFACTURING PROCESS; MAXIMUM STRESS; MOBILE APPLICATIONS; MOBILE PHONE APPLICATIONS; MOLD MATERIALS; MOLDING COMPOUND; ON-WAFER; PACKAGE LEVELS; PACKAGE RELIABILITY; PROCESS STEPS; RELIABILITY EVALUATION; RELIABILITY TEST; STRESS SIMULATIONS; SYSTEM IN PACKAGE TECHNOLOGIES; TEST VEHICLE; WAFER LEVEL; WARPAGES;

EID: 77955198283     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2010.5490956     Document Type: Conference Paper
Times cited : (12)

References (7)
  • 5
    • 77950928428 scopus 로고    scopus 로고
    • Structure and process development of wafer level embedded sip for mobile applications
    • Singapore, Dec.
    • Gi-Jo Jung, et al., "Structure and Process Development of wafer level embedded SiP for mobile applications", Proc. IEEE 11th Electronics Packaging Technology Conference, Singapore, Dec. 2009, p191-196
    • (2009) th Electronics Packaging Technology Conference , pp. 191-196
    • Jung, G.-J.1
  • 6
    • 35348870992 scopus 로고    scopus 로고
    • Chip embedded wafer level packaging technology for stacked RF-SiP application
    • Reno, NV, May
    • Cien-Wei Chien, Li-Cheng Shen, et al., "Chip Embedded Wafer Level Packaging Technology for Stacked RF-SiP Application, " Proc. 57th Electronic Components and Technology Conference, Reno, NV, May 2007, p305-310
    • (2007) th Electronic Components and Technology Conference , pp. 305-310
    • Chien, C.-W.1    Shen, L.-C.2
  • 7
    • 70349659174 scopus 로고    scopus 로고
    • Wafer level embedded technology for 3D wafer level embedded package
    • San Diego, CA, May
    • Aditya Kumar, Xia Dingwei, at al., "Wafer Level Embedded Technology for 3D Wafer Level Embedded Package, " Proc. 59th Electronic Components and Technology Conference, San Diego, CA, May 2009, p1289-1296
    • (2009) th Electronic Components and Technology Conference , pp. 1289-1296
    • Kumar, A.1    Dingwei, X.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.