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Volumn , Issue , 2010, Pages 309-315
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Wafer level embedded system in package (WL-eSiP) for mobile applications
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Author keywords
[No Author keywords available]
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Indexed keywords
BALL MOUNTING;
BOARD-LEVEL RELIABILITY;
CHIP SIZES;
CURVATURE EVALUATION;
DIE SIZE;
ELECTRONICS MARKETS;
FLIP-CHIP BONDING;
HIGH ASPECT RATIO;
MANUFACTURING PROCESS;
MAXIMUM STRESS;
MOBILE APPLICATIONS;
MOBILE PHONE APPLICATIONS;
MOLD MATERIALS;
MOLDING COMPOUND;
ON-WAFER;
PACKAGE LEVELS;
PACKAGE RELIABILITY;
PROCESS STEPS;
RELIABILITY EVALUATION;
RELIABILITY TEST;
STRESS SIMULATIONS;
SYSTEM IN PACKAGE TECHNOLOGIES;
TEST VEHICLE;
WAFER LEVEL;
WARPAGES;
ASPECT RATIO;
AUTOMOBILE ELECTRONIC EQUIPMENT;
DIELECTRIC MATERIALS;
DIES;
EMBEDDED SYSTEMS;
FABRICATION;
FLIP CHIP DEVICES;
INTERNET PROTOCOLS;
MOLDING;
MOLDS;
OPTIMIZATION;
PACKAGING;
RELIABILITY;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
SUBSTRATES;
TECHNOLOGY;
TELECOMMUNICATION EQUIPMENT;
TELEPHONE SYSTEMS;
THERMAL CONDUCTIVITY;
WAFER BONDING;
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EID: 77955198283
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ECTC.2010.5490956 Document Type: Conference Paper |
Times cited : (12)
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References (7)
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