SCOPUS 정보 검색 플랫폼

Volumn 47, Issue 6-8, 2002, Pages 197-301

Dynamic atomic force microscopy methods

a INSTITUTO DE MICROELECTRÓNICA DE MADRID (Spain)

b UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

Author keywords

Amplitude modulation AFM; Atomic force microscopy; Dynamic force microscopy; Frequency modulation AFM; Scanning probe microscopy; Tapping mode AFM

Indexed keywords

AMPLITUDE MODULATION; FEEDBACK CONTROL; FREQUENCY MODULATION; IMAGE RECONSTRUCTION; MOLECULES; NANOSTRUCTURED MATERIALS; OPTICAL RESOLVING POWER; OSCILLATIONS; PERTURBATION TECHNIQUES; PROTEINS; SCANNING; SURFACE TOPOGRAPHY; ULTRAHIGH VACUUM;

DYNAMIC FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0036712485 PISSN: 01675729 EISSN: None Source Type: Journal
DOI: 10.1016/s0167-5729(02)00077-8 Document Type: Review

Times cited : (1766)

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