Phase imaging and stiffness in tapping-mode atomic force microscopy

Surface Science

Volumn 375, Issue 2-3, 1997, Pages

  Magonov, S N ^a   Elings, V ^a   Whangbo, M H ^b  

^a Digital Instruments   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Amorphous surfaces; Atomic force microscopy; Morphology; Roughness; Surface relaxation and reconstruction; Surface structure; Topography

Indexed keywords

AMORPHOUS MATERIALS; ELASTIC MODULI; IMAGING TECHNIQUES; MORPHOLOGY; RELAXATION PROCESSES; STIFFNESS; SURFACE PHENOMENA; SURFACE ROUGHNESS;

FREE AMPLITUDE; PHASE IMAGING; SET-POINT TAPPING AMPLITUDE; SURFACE RECONSTRUCTION; SURFACE TOPOGRAPHY; TAPPING-MODE ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0031122070     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01591-9     Document Type: Article

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