Atom-resolved image of the tio2(110) surface by noncontact atomic force microscopy

Physical Review Letters

Volumn 79, Issue 21, 1997, Pages 4202-4205

  Fukui, Ken Ichi ^a   Onishi, Hiroshi ^a   Iwasawa, Yasuhiro ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 6144250626     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.79.4202     Document Type: Article

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