Tip motion in amplitude modulation (tapping-mode) atomic-force microscopy: Comparison between continuous and point-mass models

Applied Physics Letters

Volumn 80, Issue 9, 2002, Pages 1646-1648

  Rodríguez, Tomás R ^a   García, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AIR ENVIRONMENT; COMPARATIVE STUDIES; CONTINUOUS MODELS; EIGEN MODES; EXCITATION FORCE; EXCITATION FREQUENCY; FREQUENCY COMPONENTS; FUNDAMENTAL RESONANCE FREQUENCY; HIGH-ORDER; HIGHER HARMONICS; HIGHER ORDER; QUALITY FACTORS; SETPOINTS; STANDARD OPERATING CONDITIONS; TAPPING MODES; THREE ORDERS OF MAGNITUDE; TIP-SURFACE INTERACTION;

AMPLITUDE MODULATION; NANOCANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 79956019982     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1456543     Document Type: Article

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