Description of the frequency dependence of the amplitude and phase angle of a silicon cantilever tapping on a silicon substrate by the harmonic approximation

Surface Science

Volumn 411, Issue 1-2, 1998, Pages

  Bar, Georg ^a   Brandsch, Rainer ^a   Whangbo, Myung Hwan ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Amplitude curves; Frequency sweep; Harmonic approximation; Hysteresis; Phase curves; Tapping mode atomic force microscopy

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; HARMONIC ANALYSIS; HYSTERESIS; SUBSTRATES; SURFACE PHENOMENA;

HARMONIC APPROXIMATION; TAPPING MODE ATOMIC FORCE MICROSCOPY;

SILICON;

EID: 0032137139     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00348-3     Document Type: Article

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