Normal and lateral force investigation using magnetically activated force sensors

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 314-319

  Jarvis, S P ^a   Yamada, H ^b   Kobayashi, K ^b   Toda, A ^c   Tokumoto, H ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c OLYMPUS CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

FORCE CONTROL; NATURAL FREQUENCIES; SENSORS;

DYNAMIC LATERAL FORCE MICROSCOPY; FORCE SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0033734207     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00545-0     Document Type: Article

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