Role of image forces in non-contact scanning force microscope images of ionic surfaces

Surface Science

Volumn 445, Issue 2-3, 2000, Pages 283-299

  Kantorovich, L N ^a   Foster, A S ^a   Shluger, A L ^a   Stoneham, A M ^a  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); METALS; SODIUM CHLORIDE; THICK FILMS; VAN DER WAALS FORCES;

IONIC SURFACE; SCANNING FORCE MICROSCOPE; SURFACE DEFECTS;

SURFACE STRUCTURE;

EID: 0033899628     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01086-9     Document Type: Article

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