Quantitative measurement of short-range chemical bonding forces

Science

Volumn 291, Issue 5513, 2001, Pages 2580-2583

  Lantz, M A ^a   Hug, H J ^a   Hoffmann, R ^a   Van Schendel, P J A ^a   Kappenberger, P ^a   Martin, S ^a   Baratoff, A ^a   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; SILICON;

SURFACE CHEMICAL REACTIVITY;

CHEMICAL ANALYSIS;

SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; ENERGY; MEASUREMENT; MICROSCOPY; MODEL; OSCILLATION; PRIORITY JOURNAL;

EID: 0035970899     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1057824     Document Type: Article

References (35)