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Volumn 61, Issue 15, 2000, Pages 9968-9971
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Physical interpretation of frequency-modulation atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000400209
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.61.9968 Document Type: Article |
Times cited : (127)
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References (36)
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