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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 19, 2000, Pages 13089-13097

Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanisms, and image interpretation

(3) Schwarz, U D a Holscher H a Wiesendanger, R a

a UNIVERSITY OF HAMBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; ARTICLE; CONTRAST ENHANCEMENT; FREQUENCY ANALYSIS; IMAGE ANALYSIS; MATHEMATICAL ANALYSIS; OPTICAL RESOLUTION; SCANNING FORCE MICROSCOPY; SURFACE PROPERTY;

EID: 0034668507 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.13089 Document Type: Article

Times cited : (28)

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