Scanning force imaging of atomic size defects on the CaF2(111) surface

Physical Review Letters

Volumn 83, Issue 4, 1999, Pages 768-771

  Reichling, M ^a   Barth, C ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001035566     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.83.768     Document Type: Article

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