SCOPUS 정보 검색 플랫폼

Physical Review Letters

Volumn 87, Issue 23, 2001, Pages 2361041-2361044

Surface relaxations, current enhancements, and absolute distances in high resolution scanning tunneling microscopy

(4) Hofer, W A a Fisher, A J a Wolkow, R A b Grutter P c

a UNIVERSITY COLLEGE LONDON (United Kingdom)

b NATIONAL RESEARCH COUNCIL CANADA (Canada)

c MCGILL UNIVERSITY (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELECTRIC CURRENTS; PROBABILITY DENSITY FUNCTION; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY;

TUNNELING CURRENTS;

SURFACE PHENOMENA;

EID: 0035803309 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (107)

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