Forces and frequency shifts in atomic-resolution dynamic-force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 24, 1997, Pages 16010-16015

  Giessibl, Franz J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000428132     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.16010     Document Type: Article

References (20)

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3. The oscillation is sustained by positive feedback: the deflection signal is fed back to the CL, some implementations actually control the magnitude of (Formula presented) others just supply a constant driving amplitude to an actuator, which shakes the CL. For piezoresistive CL’s, it is even possible to use the back action of the deflection sensor to both sense and drive the CL; see F. J. Giessibl and M. Tortonese, Appl. Phys. Lett. 70, 2529 (1997).
4. This is in contrast to “amplitude modulation (AM) technique,” the earliest non-contact technique where (Formula presented) is set by an external oscillator, see Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987).
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