Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 314-319

  Gotsmann, B ^a   Anczykowski, B ^a   Seidel, C ^a   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

61.16.Ch, Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc.; Atomic force microscopy; Dynamic force spectroscopy; Dynamic mode; Frequency modulation; Tip sample interaction

Indexed keywords

EID: 0001248862     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00547-9     Document Type: Article

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