SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 24, 2000, Pages 16944-16949

Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current

(8) Loppacher, Ch a Bammerlin, M a Guggisberg, M a Schar S a Bennewitz, R a Baratoff, A a Meyer, E a Guntherodt H J a

a UNIVERSITY OF BASEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; METAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL BOND; FORCE; MODEL; MOLECULAR INTERACTION; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; VACUUM;

EID: 0034670662 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.16944 Document Type: Article

Times cited : (100)

References (33)

1
- 0011711484
- (1987) Phys. Rev. Lett. , vol.59 , pp. 2879
- Hallmark, V.M.¹ Chian, S.² Rabolt, J.F.³ Swalen, J.D.⁴ Wilson, R.J.⁵

2
- 0000434708
- (1989) Phys. Rev. Lett. , vol.62 , pp. 59
- Wintterlin, J.¹ Wiechers, J.² Brune, H.³ Gritsch, T.⁴ Höfer, H.⁵ Behm, R.J.⁶

3
- 35949007818
- (1992) Phys. Rev. B , vol.46 , pp. 10411
- Ciraci, S.¹ Tekman, E.² Baratoff, A.³ Batra, I.P.⁴

4
- 0003529082
- (Oxford University Press, New York, Oxford), Chap. 2
- (1992) Introduction to Scanning Tunneling Microscopy
- Chen, C.J.¹

5
- 3343009894
- (1990) Phys. Rev. Lett. , vol.65 , pp. 349
- Dürig, U.¹ Züger, O.² Pohl, D.W.³

6
- 0026900137
- (1992) Ultramicroscopy , vol.42-44 , pp. 528
- Berndt, R.¹ Gimzewski, J.K.² Schlittler, R.³

7
- 0042588535
- (1983) Phys. Rev. B , vol.28 , pp. 1835
- Rose, J.H.¹ Smith, J.R.² Ferrante, J.³

8
- 21144479597
- (1993) Europhys. Lett. , vol.23 , pp. 147
- Dürig, U.¹ Züger, O.² Wang, L.C.³ Kreuzer, H.J.⁴

9
- 0000501079
- (1996) Phys. Rev. Lett. , vol.76 , pp. 1276
- Clarke, A.R.H.¹ Pethica, J.B.² Nieminen, J.A.³ Besenbacher, F.⁴ Laegsgaard, E.⁵ Stensgaard, I.⁶

10
- 0012618901
- (1986) Phys. Rev. Lett. , vol.56 , pp. 930
- Binnig, G.¹ Quate, C.F.² Gerber, Ch.³

11
- 0029637281
- (1995) Science , vol.267 , pp. 68
- Giessibl, F.J.¹

12
- 0031544163
- (1997) Probe Microscopy , vol.1 , pp. 3
- Bammerlin, M.¹ Lüthi, R.² Meyer, E.³ Baratoff, A.⁴ Lü, J.⁵ Guggisberg, M.⁶ Gerber, Ch.⁷ Howald, L.⁸ Güntherodt, H.-J.⁹

13
- 0000663474
- (1999) Appl. Surf. Sci. , vol.140 , pp. 287
- Loppacher, Ch.¹ Bammerlin, M.² Guggisberg, M.³ Battiston, F.⁴ Bennewitz, R.⁵ Rast, S.⁶ Baratoff, A.⁷ Meyer, E.⁸ Güntherodt, H.-J.⁹

14
- 0000448210
- (1999) Appl. Surf. Sci. , vol.140 , pp. 243
- Orisaka, S.¹ Minobe, T.² Uchihashi, T.³ Sugawara, Y.⁴ Morita, S.⁵

15
- 0001100769
- (2000) Phys. Rev. B , vol.61 , pp. 11151
- Guggisberg, M.¹ Bammerlin, M.² Loppacher, Ch.³ Pfeiffer, O.⁴ Abdurixit, A.⁵ Barwich, V.⁶ Bennewitz, R.⁷ Baratoff, A.⁸ Meyer, E.⁹ Güntherodt, H.-J.¹⁰

16
- 0000918375
- (1993) Appl. Phys. Lett. , vol.63 , pp. 117
- Howald, L.¹ Meyer, E.² Lüthi, R.³ Haefke, H.⁴ Overney, R.⁵ Rudin, H.⁶ Güntherodt, H.-J.⁷

17
- 33744636144
- Nanosensors GmbH, Wetzlar, Germany; 0.01 - 0.02 Ω m n-doped silicon cantilever

18
- 0000428132
- (1997) Phys. Rev. B , vol.56 , pp. 16010
- Giessibl, F.J.¹

19
- 0000400209
- (2000) Phys. Rev. B , vol.61 , pp. 9968
- Giessibl, F.J.¹ Bielefeldt, H.²

20
- 0000894352
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66
- Loppacher, Ch.¹ Bammerlin, M.² Battiston, F.M.³ Guggisberg, M.⁴ Müller, D.⁵ Hidber, H.R.⁶ Lüthi, R.⁷ Meyer, E.⁸ Güntherodt, H.-J.⁹

21
- 33744616568
- note

22
- 33744556529
- note

23
- 0043028832
- (1999) Appl. Phys. Lett. , vol.75 , pp. 433
- Dürig, U.¹

24
- 0042596028
- (1999) Phys. Rev. Lett. , vol.83 , pp. 4780
- Hölscher, H.¹ Allers, W.² Schwarz, U.D.³ Schwarz, A.⁴ Wiesendanger, R.⁵

25
- 34249899898
- (1998) Appl. Phys. A: Mater. Sci. Process. , vol.66
- Bammerlin, M.¹ Lüthi, R.² Meyer, E.³ Baratoff, A.⁴ Lü, J.⁵ Guggisberg, M.⁶ Loppacher, Ch.⁷ Gerber, Ch.⁸ Güntherodt, H.-J.⁹

26
- 16644368584
- (1992) Phys. Rev. B , vol.42 , pp. 7618
- Ciraci, S.¹ Baratoff, A.² Batra, I.P.³

27
- 33744644728
- note

28
- 7244257550
- (1996) Phys. Rev. Lett. , vol.76 , pp. 1485
- Olesen, L.¹ Brandbyge, M.² Sørensen, M.R.³ Jacobsen, K.W.⁴ Laensgaard, E.⁵ Stensgaard, I.⁶ Besenbacher, F.⁷

29
- 0003529082
- (Oxford University Press, New York, Oxford), Chap. 7
- (1992) Introduction to Scanning Tunneling Microscopy
- Chen, C.J.¹

30
- 33744572650
- (1960) Phys. Rev. Lett. , vol.6 , pp. 57
- Bardeen, J.¹

31
- 0022786133
- (1986) IBM J. Res. Dev. , vol.30 , pp. 455
- Coombs, J.M.¹ Pethica, J.B.²

32
- 9144258943
- (1963) J. Appl. Phys. , vol.34 , pp. 1793
- Simmons, J.G.¹

33
- 0001621031
- (1988) Surf. Sci. , vol.198
- Coombs, J.M.¹ Welland, M.E.² Pethica, J.B.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.