Atomic resolved imaging of cleaved NiO(100) surfaces by NC-AFM

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 218-221

  Hosoi, H ^a   Sueoka, K ^a,b   Hayakawa, K ^a   Mukasa, K ^a,b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL DEFECTS; CRYSTAL LATTICES; IMAGING TECHNIQUES; SINGLE CRYSTALS;

NICKEL OXIDE; NONCONTACT ATOMIC FORCE MICROSCOPY;

NICKEL COMPOUNDS;

EID: 0033741870     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00529-2     Document Type: Article

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