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Volumn 48, Issue 3, 1999, Pages 276-279

Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0033216544     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1999-00477-3     Document Type: Article
Times cited : (40)

References (15)
  • 12
    • 0009289754 scopus 로고    scopus 로고
    • A theoretical simulation of dynamic mode SFM images acquired on HOPG, which gives deeper insight into the underlying measurement process, will be published elsewhere [13]
    • A theoretical simulation of dynamic mode SFM images acquired on HOPG, which gives deeper insight into the underlying measurement process, will be published elsewhere [13].
  • 13
    • 0009203996 scopus 로고    scopus 로고
    • HÖLSCHER H., ALLERS W., SCHWARZ A., SCHWARZ U. D. WIESENDANGER R., in preparation
    • HÖLSCHER H., ALLERS W., SCHWARZ A., SCHWARZ U. D. and WIESENDANGER R., in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.