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Volumn 48, Issue 3, 1999, Pages 276-279
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Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0033216544
PISSN: 02955075
EISSN: None
Source Type: Journal
DOI: 10.1209/epl/i1999-00477-3 Document Type: Article |
Times cited : (40)
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References (15)
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