Metallic adhesion forces and tunneling between atomically defined tip and sample

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 274-279

  Schirmeisen, A ^a   Cross, G ^a,b   Stalder, A ^a   Grutter P ^a   Durig U ^b  

^a MCGILL UNIVERSITY   (Canada)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FORCE MEASUREMENT; GOLD; HYSTERESIS; MICROSCOPIC EXAMINATION; POLYCRYSTALLINE MATERIALS; TUNGSTEN; WETTING;

FIELD ION MICROSCOPY; METALLIC ADHESION;

ADHESION;

EID: 0033732922     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00539-5     Document Type: Article

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