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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 20, 2000, Pages 13667-13673

Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy

(3) Stifter, Thomas a Marti, Othmar a Bhushan, Bharat b

a UNIVERSITY OF ULM (Germany)

b Ohio State University (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CALCULATION; FORCE; GEOMETRY; HUMIDITY; HYDROPHOBICITY; MATHEMATICAL MODEL; SCANNING FORCE MICROSCOPY; SURFACE TENSION;

EID: 0034668528 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.13667 Document Type: Article

Times cited : (210)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.