True atomic resolution imaging of surface structure and surface charge on the GaAs(110)

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 371-375

  Sugawara, Yasuhiro ^a   Uchihashi, Takayuki ^a   Abe, Masayuki ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

61.16CH; 68.35.Bs; 68.35.Dv; APN; Atomic force microscope; Atomic resolution; Defect; Electrostatic force microscope; GD

Indexed keywords

EID: 0001639656     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00557-1     Document Type: Article

References (19)

1. Martin Y., Abraham D.W., Wickramasinghe H.K. Appl. Phys. Lett. 52:1988;1103.
2. D. Sarid, Scanning Force Microscopy, Oxford University Press, Oxford, 1991, pp. 129-151.
3. Nonnenmacher M., O'Boyle M.P., Wickramasinghe H.K. Appl. Phys. Lett. 58:1991;2921.
4. Terris B.D., Stern J.E., Rugar D., Mamin H.J. Phys. Rev. Lett. 63:1989;2669.
5. Stern J.E., Terris B.D., Mamin H.J., Rugar D. Appl. Phys. Lett. 53:1988;2717.
6. Giessibl F.J. Science. 267:1995;1451.
7. Kitamura S., Iwatsuki M. Jpn. J. Appl. Phys. 34:1995;L145.
8. Erlandsson R., Olsson L., Martensson P. Phys. Rev. B. 54:1996;8309.
9. Nakagiri N., Suzuki M., Okiguchi K., Sugimura H. Surf. Sci. 373:1997;L329.
10. Sugawara Y., Ueyama H., Uchihashi T., Ohta M., Morita S., Suzuki M., Mishima S. Appl. Surf. Sci. 113/114:1997;364.
11. Sugawara Y., Ohta M., Ueyama H., Morita S. Science. 270:1995;1646.
12. Ueyama H., Ohta M., Sugawara Y., Morita S. Jpn. J. Appl. Phys. 34:1995;L1086.
13. Albrecht T.R., Grütter P., Horne D., Rugar D. J. Appl. Phys. 69:1991;668.
14. Kikukawa A., Hosaka S., Imura R. Appl. Phys. Lett. 66:1995;3510.
15. Uchihashi T., Ohta M., Sugawara Y., Yanase Y., Shigematsu T., Suzuki M., Morita S. J. Vac. Sci. Technol. B. 15:1997;1543.
16. Yokoyama H., Inoue T. Thin Solid Films. 242:1994;33.
17. Ohta M., Sugawara Y., Morita S., Nagaoka H., Mishima S., Okada T. J. Vac. Sci. Technol. B. 12:1994;1705.
18. Domke C., Ebert Ph., Heinrich M., Urban K. Phys. Rev. B. 54:1996;10288.
19. Itoh J., Tohma Y., Inoue T., Yokoyama H., Shimizu K. Jpn. J. Appl. Phys. 33:1994;7167.