Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Applied Physics Letters

Volumn 76, Issue 11, 2000, Pages 1470-1472

  Giessibl, Franz J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001641601     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126067     Document Type: Article

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