Atomic resolution noncontact atomic force and scanning tunneling microscopy of TiO2(110)-(1 × 1) and -(1 × 2): Simultaneous imaging of surface structures and electronic states

Physical Review Letters

Volumn 86, Issue 19, 2001, Pages 4334-4337

  Ashino, M ^a   Sugawara, Y ^a,b   Morita, S ^b   Ishikawa, M ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; VAN DER WAALS FORCES;

NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

TITANIUM COMPOUNDS;

EID: 0035820974     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.4334     Document Type: Article

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