Models of image contrast in scanning force microscopy on insulators

Journal of Physics Condensed Matter

Volumn 11, Issue 26, 1999, Pages

  Shluger, A L ^a   Livshits, A I ^a,b   Foster, A S ^a   Catlow, C R A ^b  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b DAVY FARADAY RESEARCH LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; COMPUTER SIMULATION; ELECTRIC INSULATORS; IMAGE ANALYSIS; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; OPTICAL RESOLVING POWER; POINT DEFECTS;

SCANNING FORCE MICROSCOPY (SFM);

MICROSCOPIC EXAMINATION;

EID: 0032593981     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/11/26/201     Document Type: Article

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