Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation

Surface Science

Volumn 457, Issue 1, 2000, Pages 219-228

  Stark, Robert W ^a   Heckl, Wolfgang M ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; DEGREES OF FREEDOM (MECHANICS); FOURIER TRANSFORMS; FREQUENCY DOMAIN ANALYSIS; FREQUENCY RESPONSE; MATHEMATICAL MODELS; NATURAL FREQUENCIES; SURFACE PROPERTIES;

ANHARMONIC OSCILLATIONS; TAPPING MODE ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0033726176     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00378-2     Document Type: Article

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