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Surface Science

Volumn 460, Issue 1-3, 2000, Pages 292-300

Optimizing phase imaging via dynamic force curves

(6) Chen, X a Davies, M C a Roberts, C J a Tendler, S J B a Williams, P M a Burnham, N A b

a UNIVERSITY OF NOTTINGHAM (United Kingdom)

b Worcester Polytechnic Institute (United States)

Author keywords

Atomic force microscopy; Computer simulations; Models of non linear phenomena

Indexed keywords

EID: 0001450076 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(00)00574-4 Document Type: Article

Times cited : (74)

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