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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 20, 2000, Pages 13674-13679

Experimental aspects of dissipation force microscopy

(9) Loppacher, C a Bennewitz, R a Pfeiffer, O a Guggisberg, M a Bammerlin, M a Schar S a Barwich, V a Baratoff, A a Meyer, E a

a UNIVERSITY OF BASEL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; ELECTRON BEAM; OSCILLATION; SCANNING PROBE MICROSCOPY; VACUUM;

EID: 0034668524 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.13674 Document Type: Article

Times cited : (110)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.